CONTACT
PULSTEC

s-Laue Single Crystal Orientation System

Features
Small and easy to handle.
  • Enable to acquire images (Laue spots) of single crystal materials quickly.
  • Integrated desk top model of an air-cooled X-ray generator and a high-sensitivity detector.
  • The X-rays are incident vertically downward to make setting the sample as simple as possible.
  • Enable to achieve precise alignment using the system's integrated microscope.
  • Extremely lightweight and compact, making it ideal for most workspaces.
Applications
  • Measuring Principle Plane Orientation
  • Checking & Adjusting Cutting Orientation
  • Evaluating Crystallinity
  • Analyzing Processing-Related Crystal Growth
  • Manufacturing and R&D for semiconductor devices.

Contact Us - Product

There are some imperfect input data. Please check and correct the red-colored section.

Content of Inquiry

Required
*You may attach the image of the object you need to measure when the next screen is displayed.

Customer Information

Company/Corporate Name
Required
Department Name
Required
Your Name
Required
Address
Required
Building Name
Telephone Number
Required
Facsimile Number
Email Address
Invalid format or blank
Email (for confirmation)
Input difference
  • ■The personal information you enter above will be used for our reply to customer's inquiries, opinions, etc.
  • ■All these pieces of personal information will be appropriately managed by us under proper safety measures, and shall not, as a rule, be disclosed or provided to any third party without your consent. For further details, see our Basic Policy on the Protection of Personal Information.
Conform
 
Content of Inquiry
Company/Corporate Name
Department Name
Your Name
Address
Building Name
Telephone Number
Facsimile Number
Email Address

Attach file

You may attach the image of the object you need to measure.
Back
Send
 
 
 
top of page